DocumentCode :
600043
Title :
A new material concept for three-dimensional tactile piezoresistive force sensors
Author :
Jordan, A. ; Buttgenbach, Stephanus
Author_Institution :
Inst. for Microtechnol., Tech. Univ. Braunschweig, Braunschweig, Germany
fYear :
2012
fDate :
Aug. 29 2012-Sept. 1 2012
Firstpage :
196
Lastpage :
199
Abstract :
The purpose of this paper is to present a new material concept to develop highly sensitive three-dimensional tactile force sensors. Conventional three-dimensional force sensors are based on silicon with integrated diffused silicon piezoresistors. Micromechanical force sensors using a soft material instead, e. g. SU-8 resist, would be more sensitive for static deflection measurements. As a characteristic factor for the sensitivity, the ratio of the gauge factor k to the Young´s modulus E is presented for different sensor types. Beside silicon, especially gold, carbon black particles, and diamond-like carbon is taken into consideration as piezoresistive material. In addition four different SU-8 sensor prototypes are mechanically characterized with regard to their bending stiffness, probing forces at different deflections, and breaking points.
Keywords :
Young´s modulus; diamond-like carbon; elemental semiconductors; force sensors; microfabrication; microsensors; piezoelectric transducers; piezoresistive devices; silicon; tactile sensors; Au; C; SU-8 resist; SU-8 sensor prototypes; Si; Young modulus; bending stiffness; breaking points; carbon black particles; diamond-like carbon; highly sensitive three-dimensional tactile force sensors; material concept; microfabrication; micromechanical force sensors; piezoresistive material; piezoresistors; static deflection measurements; Force; Force sensors; Piezoresistance; Piezoresistive devices; Semiconductor device measurement; Silicon; MEMS; SU-8; microfabrication; microsensors; piezo-resistance; tactile sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
Conference_Location :
Shaanxi
Print_ISBN :
978-1-4673-4588-0
Electronic_ISBN :
978-1-4673-4589-7
Type :
conf
DOI :
10.1109/3M-NANO.2012.6472942
Filename :
6472942
Link To Document :
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