• DocumentCode
    600043
  • Title

    A new material concept for three-dimensional tactile piezoresistive force sensors

  • Author

    Jordan, A. ; Buttgenbach, Stephanus

  • Author_Institution
    Inst. for Microtechnol., Tech. Univ. Braunschweig, Braunschweig, Germany
  • fYear
    2012
  • fDate
    Aug. 29 2012-Sept. 1 2012
  • Firstpage
    196
  • Lastpage
    199
  • Abstract
    The purpose of this paper is to present a new material concept to develop highly sensitive three-dimensional tactile force sensors. Conventional three-dimensional force sensors are based on silicon with integrated diffused silicon piezoresistors. Micromechanical force sensors using a soft material instead, e. g. SU-8 resist, would be more sensitive for static deflection measurements. As a characteristic factor for the sensitivity, the ratio of the gauge factor k to the Young´s modulus E is presented for different sensor types. Beside silicon, especially gold, carbon black particles, and diamond-like carbon is taken into consideration as piezoresistive material. In addition four different SU-8 sensor prototypes are mechanically characterized with regard to their bending stiffness, probing forces at different deflections, and breaking points.
  • Keywords
    Young´s modulus; diamond-like carbon; elemental semiconductors; force sensors; microfabrication; microsensors; piezoelectric transducers; piezoresistive devices; silicon; tactile sensors; Au; C; SU-8 resist; SU-8 sensor prototypes; Si; Young modulus; bending stiffness; breaking points; carbon black particles; diamond-like carbon; highly sensitive three-dimensional tactile force sensors; material concept; microfabrication; micromechanical force sensors; piezoresistive material; piezoresistors; static deflection measurements; Force; Force sensors; Piezoresistance; Piezoresistive devices; Semiconductor device measurement; Silicon; MEMS; SU-8; microfabrication; microsensors; piezo-resistance; tactile sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
  • Conference_Location
    Shaanxi
  • Print_ISBN
    978-1-4673-4588-0
  • Electronic_ISBN
    978-1-4673-4589-7
  • Type

    conf

  • DOI
    10.1109/3M-NANO.2012.6472942
  • Filename
    6472942