DocumentCode :
600047
Title :
Initiation of nano-film bucklings under low-frequency alternate loads
Author :
Zhiming Guo ; Shibin Wang ; Diqiang Cui ; Haikun Jia ; Linan Li
Author_Institution :
Dept. of Mech., Tianjin Univ., Tianjin, China
fYear :
2012
fDate :
Aug. 29 2012-Sept. 1 2012
Firstpage :
343
Lastpage :
346
Abstract :
In this paper, we investigated the initiation of the straight-side buckling of the compressed thin film on flat PMMA substrate under alternate loads, with emphasis on the influences of loading frequency, film thickness and load amplitude on the initiation of the buckling, respectively. A fatigue-loading device based on piezoelectric ceramics has been designed for making the cyclic loadings available. The instability phenomenon has been recorded using a CCD camera and an optical microscope. The aluminum and copper thin films were studied in the experiments, the different loading modes have been involved in detailed experimental analysis. At present, experimental investigations of thin film buckling under cyclic load may be an efficient engineering solution in many practical fields such as micro-electro-mechanical systems(MEMS).
Keywords :
CCD image sensors; aluminium; buckling; copper; fatigue; metallic thin films; nanostructured materials; optical microscopy; piezoceramics; Al; CCD camera; Cu; MEMS; aluminum thin films; compressed thin film; copper thin films; cyclic loadings; fatigue-loading device; film thickness; flat PMMA substrate; instability phenomenon; load amplitude; loading frequency; loading modes; low-frequency alternate loads; microelectromechanical systems; nanofilm bucklings; optical microscopy; piezoelectric ceramics; straight-side buckling; Cameras; Charge coupled devices; Fatigue; Films; Loading; Metals; Substrates; alternate load; digital image; fatigue buckling; thin film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
Conference_Location :
Shaanxi
Print_ISBN :
978-1-4673-4588-0
Electronic_ISBN :
978-1-4673-4589-7
Type :
conf
DOI :
10.1109/3M-NANO.2012.6472946
Filename :
6472946
Link To Document :
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