• DocumentCode
    600051
  • Title

    Nanotribological behaviors of friction-induced hillocks on monocrystalline silicon

  • Author

    Long Hua ; Bingjun Yu ; Chenfei Song ; Linmao Qian ; Zhongrong Zhou

  • Author_Institution
    Nat. Traction Power Lab., Southwest Jiaotong Univ., Chengdu, China
  • fYear
    2012
  • fDate
    Aug. 29 2012-Sept. 1 2012
  • Firstpage
    80
  • Lastpage
    83
  • Abstract
    With an atomic force microscope, friction and wear behaviors of the friction induced hillocks on monocrystalline silicon were investigated. With the increase of normal load from one to twelve microNewtown, the friction force on silicon substrate showed a sharp increase at eight microNewtown, while the friction force on the hillocks kept a stably linear increase. Since no scratch damage was detected on the hillock below a contact pressure of ten point three gigaPascal, the friction induced hillocks on silicon can withstand the typical contact and sliding in dynamic devices. It was also noted that the friction induced hillock presented anisotropic friction and wear behaviors during scratching. The sliding parallel to the scanning direction for producing the hillock can reduce the friction in dynamic devices. This study can shed new light on potential application of the friction induced nanostructures.
  • Keywords
    atomic force microscopy; crystal structure; elemental semiconductors; mechanical contact; silicon; sliding friction; wear; Si; anisotropic friction; atomic force microscopy; contact pressure; dynamic devices; friction force; friction induced hillocks; friction induced nanostructures; microNewtown; monocrystalline silicon substrate; nanotribological behaviors; potential application; scanning direction; scratch damage; scratching; sliding; wear behaviors; Atomic force microscopy; Force; Friction; Micromechanical devices; Silicon; Surface topography; friction induced hillock; monocrystalline silicon; nanofabrication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
  • Conference_Location
    Shaanxi
  • Print_ISBN
    978-1-4673-4588-0
  • Electronic_ISBN
    978-1-4673-4589-7
  • Type

    conf

  • DOI
    10.1109/3M-NANO.2012.6472950
  • Filename
    6472950