DocumentCode
600057
Title
3D topography of the micro cracks of subsurface damages by etching process
Author
Hairong Wang ; Cheng Guan ; Bike Zhang ; Guoying Yuan
Author_Institution
State Key Lab. for Manuf. Syst. Eng., Xi´´an Jiaotong Univ., Xi´´an, China
fYear
2012
fDate
Aug. 29 2012-Sept. 1 2012
Firstpage
355
Lastpage
359
Abstract
The existence of the subsurface damage of high-precision components is becoming a bottleneck for better performance of high-precision components in the fields of energy, space, national defense equipment, integrated circuit, MEMS and so on. So far there is still no method which is capable of characterizing the 3D topography of subsurface fractures, and this paper presents an idea of investigating the full information of the subsurface damages based on the etching experiments. By micro-indentations some individual subsurface damages with specific geometrical cracks were artificially prepared first, and then dealt with the conventional etching process. The etching process was carried out in the differential mode, namely etching with certain interval time. All 3D topographies of etched cracks during etching were recorded and, dimensions of initial fractures including length, width, depth, etc. were calculated according to the 3D data. Comparison of the calculated results and designed geometrical features indicated that the method used in the paper is a valid method to roughly characterize 3D information of the fractures of the subsurface damage layer and in discussion we proposed a numerical model to accurately characterize the initial 3D holographic information of fractures.
Keywords
etching; fracture; holography; indentation; microcracks; numerical analysis; surface cracks; surface topography; 3D data; 3D topography; conventional etching; etched cracks; geometrical cracks; high-precision components; initial 3D holographic information; initial fracture depth; initial fracture length; initial fracture width; microcracks; microindentations; numerical model; subsurface damage layer; subsurface fractures; Etching; Glass; Surface cracks; Surface morphology; Surface topography; 3D topography; high-precision components; holographic information; micro cracks; subsurface damage;
fLanguage
English
Publisher
ieee
Conference_Titel
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
Conference_Location
Shaanxi
Print_ISBN
978-1-4673-4588-0
Electronic_ISBN
978-1-4673-4589-7
Type
conf
DOI
10.1109/3M-NANO.2012.6472957
Filename
6472957
Link To Document