DocumentCode :
600059
Title :
Analysis of measuring errors of micro-deformation using speckle digital image correlation
Author :
Zhong Chen ; Xianmin Zhang ; Xiaofeng Zhou
Author_Institution :
GuangDong Province Key Lab. of Precision Equipments & Manuf. Technol., South China Univ. of Technol., Guangzhou, China
fYear :
2012
fDate :
Aug. 29 2012-Sept. 1 2012
Firstpage :
402
Lastpage :
406
Abstract :
Speckle digital image correlation (DIC) method has extended its application to micro-deformation measurement in nanoscale except for in microscale and macroscale. Because of its micro-deformation errors mainly depend upon the correct selection of the parameters of DIC method and its hardware setup, key parameters and how these parameters influence the measuring accuracy should be clarified in detail. So the microdeformation measuring errors using DIC method are evaluated in different conditions of the parameters in deformation simulation experiments and the practical tensile test experiments, considering the difficulties of micro-deformation measuring experiment setup in nanoscale, and Some suggestions has been presented.
Keywords :
image processing; speckle; measuring errors analysis; micro-deformation errors; micro-deformation measurement; speckle digital image correlation; tensile test; Correlation; Measurement uncertainty; Nanoscale devices; Optical imaging; Size measurement; Speckle; Strain; Speckle digital image correlation; measuring errors; micro-deformation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
Conference_Location :
Shaanxi
Print_ISBN :
978-1-4673-4588-0
Electronic_ISBN :
978-1-4673-4589-7
Type :
conf
DOI :
10.1109/3M-NANO.2012.6472959
Filename :
6472959
Link To Document :
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