• DocumentCode
    600059
  • Title

    Analysis of measuring errors of micro-deformation using speckle digital image correlation

  • Author

    Zhong Chen ; Xianmin Zhang ; Xiaofeng Zhou

  • Author_Institution
    GuangDong Province Key Lab. of Precision Equipments & Manuf. Technol., South China Univ. of Technol., Guangzhou, China
  • fYear
    2012
  • fDate
    Aug. 29 2012-Sept. 1 2012
  • Firstpage
    402
  • Lastpage
    406
  • Abstract
    Speckle digital image correlation (DIC) method has extended its application to micro-deformation measurement in nanoscale except for in microscale and macroscale. Because of its micro-deformation errors mainly depend upon the correct selection of the parameters of DIC method and its hardware setup, key parameters and how these parameters influence the measuring accuracy should be clarified in detail. So the microdeformation measuring errors using DIC method are evaluated in different conditions of the parameters in deformation simulation experiments and the practical tensile test experiments, considering the difficulties of micro-deformation measuring experiment setup in nanoscale, and Some suggestions has been presented.
  • Keywords
    image processing; speckle; measuring errors analysis; micro-deformation errors; micro-deformation measurement; speckle digital image correlation; tensile test; Correlation; Measurement uncertainty; Nanoscale devices; Optical imaging; Size measurement; Speckle; Strain; Speckle digital image correlation; measuring errors; micro-deformation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
  • Conference_Location
    Shaanxi
  • Print_ISBN
    978-1-4673-4588-0
  • Electronic_ISBN
    978-1-4673-4589-7
  • Type

    conf

  • DOI
    10.1109/3M-NANO.2012.6472959
  • Filename
    6472959