Title :
Role of electric field distribution in local anodic oxidation
Author :
Kexiang Hu ; Qingkang Wang ; Peihua Wangyang
Author_Institution :
Key Lab. for Thin Film & Microfabrication, Technol. of Minist. of Educ., Shanghai Jiao Tong Univ., Shanghai, China
fDate :
Aug. 29 2012-Sept. 1 2012
Abstract :
Local electric-field-induced anodic oxidation is one of the earliest and most extensively studied techniques in bias-assisted AFM nanolithography. Except the water bridge created between the tip and the sample surface, local anodic oxidation (LAO) process strongly depends on the tip-sample voltage and especially on the electric field distribution under the tip apex center. Once electric field is formed, its distribution and intensity can be modified by changing the tip-sample voltage and separation. The electric field provides the oxidation kinetics of nanoscale electrochemical reaction and controls the spacial resolution of the fabricated structures. In this paper, the s-wave tip quantum model, the influence of the bias voltage and the electric field strength on oxide structures and the theory of electric-field-induced LAO have been analyzed. In addition, dot-array nanogratings, one-dimensional nanogratings and two-dimensional nanogratings are fabricated by using electric-field-induced LAO process with AFM in the ambient atmosphere.
Keywords :
anodisation; atomic force microscopy; electric field measurement; nanolithography; AFM nanolithography; dot-array nanogratings; electric field distribution; local anodic oxidation; one-dimensional nanogratings; s-wave tip quantum model; tip-sample voltage; water bridge; Electric fields; Nanolithography; Nanoscale devices; Oxidation; Predictive models; Probes; Surface treatment; Anodic oxidation; Electric field intensity; Nanofabrication; Nanogratings; Nanoscale electrochemical reaction;
Conference_Titel :
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
Conference_Location :
Shaanxi
Print_ISBN :
978-1-4673-4588-0
Electronic_ISBN :
978-1-4673-4589-7
DOI :
10.1109/3M-NANO.2012.6472980