DocumentCode :
600074
Title :
Development of a compact nano manipulator based on an atomic force microscope: For monitoring using a scanning electron microscope or an inverted optical microscope
Author :
Iwata, Futoshi ; Takahashi, Masaharu ; Ko, Hanseok ; Adachi, Masakazu
Author_Institution :
Dept. of Mech. Eng., Shizuoka Univ., Hamamatsu, Japan
fYear :
2012
fDate :
Aug. 29 2012-Sept. 1 2012
Firstpage :
22
Lastpage :
27
Abstract :
In this paper, we describe a novel nano manipulator based on an atomic force microscope (AFM). The body of the manipulator is enough compact to be operated inside the sample chamber of a scanning electron microscope (SEM). In order to realize the compact body, we employed a self-detection type cantilever for AFM observation. The cantilever includes strain resistance element, which can easily detect a deflection signal of the cantilever without other sensing devices such as optical lever systems. It is possible to observe the manipulation situation in the real time observation by using the SEM. The AFM manipulator is coupled with a haptic device for human interface. Thus, by using this system, the operator can move the AFM probe at any position on the surface with feeling the interaction force detected by the cantilever on the sample surface according to the cantilever deflection. As a performance of the system, biological samples were controllably manipulated under the SEM observation. Furthermore, in order to deal with biological samples in liquid condition, the manipulator can be coupled with an inverted optical microscope. By using the system, we successfully demonstrated manipulation of biological samples in liquid condition. Two AFM manipulators could be used for dissection of biological samples like a knife and fork.
Keywords :
atomic force microscopy; cantilevers; haptic interfaces; manipulators; optical microscopes; scanning probe microscopy; AFM manipulators; AFM observation; AFM probe; SEM observation; atomic force microscope; biological sample dissection; biological sample manipulation; biological samples; cantilever deflection signal detection; compact nanomanipulator development; haptic device; human interface; interaction force; inverted optical microscope; liquid condition; scanning electron microscope; self-detection type cantilever; sensing devices; strain resistance element; Biology; Haptic interfaces; Liquids; Manipulators; Probes; Scanning electron microscopy; AFM; SEM; haptic deevice; manipulation; nanofabrication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2012 International Conference on
Conference_Location :
Shaanxi
Print_ISBN :
978-1-4673-4588-0
Electronic_ISBN :
978-1-4673-4589-7
Type :
conf
DOI :
10.1109/3M-NANO.2012.6472981
Filename :
6472981
Link To Document :
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