• DocumentCode
    600196
  • Title

    Optimal unknown bit filtering for test response masking

  • Author

    Ding-ke Weng ; Jiann-Chyi Rau ; Cheng-Han Lin

  • Author_Institution
    Dept. of Electr. Eng., Tamkang Univ., Taipei, Taiwan
  • fYear
    2012
  • fDate
    4-7 Nov. 2012
  • Firstpage
    787
  • Lastpage
    791
  • Abstract
    In this paper presents a new X-Masking scheme for response compaction. It filters all X states from test response that can no unknown value input to response compactor. In the experimental results, this scheme increased less control data and maintain same observability.
  • Keywords
    automatic test pattern generation; filtering theory; logic testing; X-masking scheme; optimal unknown bit filtering; response compaction; test response masking; Built-in self-test; Circuit faults; Compaction; Computer architecture; Flip-flops; Observability; XML; compactor; response compaction; response unknown; x-masking;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Intelligent Signal Processing and Communications Systems (ISPACS), 2012 International Symposium on
  • Conference_Location
    New Taipei
  • Print_ISBN
    978-1-4673-5083-9
  • Electronic_ISBN
    978-1-4673-5081-5
  • Type

    conf

  • DOI
    10.1109/ISPACS.2012.6473598
  • Filename
    6473598
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=600196