Title :
Optimal unknown bit filtering for test response masking
Author :
Ding-ke Weng ; Jiann-Chyi Rau ; Cheng-Han Lin
Author_Institution :
Dept. of Electr. Eng., Tamkang Univ., Taipei, Taiwan
Abstract :
In this paper presents a new X-Masking scheme for response compaction. It filters all X states from test response that can no unknown value input to response compactor. In the experimental results, this scheme increased less control data and maintain same observability.
Keywords :
automatic test pattern generation; filtering theory; logic testing; X-masking scheme; optimal unknown bit filtering; response compaction; test response masking; Built-in self-test; Circuit faults; Compaction; Computer architecture; Flip-flops; Observability; XML; compactor; response compaction; response unknown; x-masking;
Conference_Titel :
Intelligent Signal Processing and Communications Systems (ISPACS), 2012 International Symposium on
Conference_Location :
New Taipei
Print_ISBN :
978-1-4673-5083-9
Electronic_ISBN :
978-1-4673-5081-5
DOI :
10.1109/ISPACS.2012.6473598
