DocumentCode :
600561
Title :
Integrated in-band optical signal-to-noise ratio (OSNR) monitor implemented in SOI platform
Author :
Lianxi Jia ; Junfeng Song ; Tsung-Yang Liow ; Mingbin Yu ; Lo, G.Q. ; Dim-Lee Kwong
Author_Institution :
Inst. of Microelectron., A*STAR (Agency of Sci. & Technol. Res.), Singapore, Singapore
fYear :
2012
fDate :
4-8 March 2012
Firstpage :
1
Lastpage :
3
Abstract :
Based on the different coherence properties of signal and noise, we measured the in-band optical signal-to-noise ratio using integrated thermally tunable Mach-Zehnder optical delay interferometer in SOI platform. The experimental results show good bit-rate-independent property.
Keywords :
Mach-Zehnder interferometers; integrated optics; light coherence; silicon-on-insulator; Mach-Zehnder optical delay interferometer; OSNR; SOI; coherence properties; in-band optical signal-to-noise ratio; optical signal-to-noise ratio monitor; silicon-on-insulator; Monitoring; Optical attenuators; Optical filters; Optical interferometry; Optical noise; Optical polarization; Signal to noise ratio;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Fiber Communication Conference and Exposition (OFC/NFOEC), 2012 and the National Fiber Optic Engineers Conference
Conference_Location :
Los Angeles, CA
ISSN :
pending
Print_ISBN :
978-1-4673-0262-3
Type :
conf
Filename :
6476384
Link To Document :
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