DocumentCode :
600873
Title :
DV/DT immunity and recovery time capability of 1.0 cm2 silicon carbide SGTO
Author :
Ogunniyi, Aderinto ; O´Brien, Heather ; Scozzie, C.J. ; Shaheen, W. ; Agarwal, Abhishek ; Lin Cheng ; Temple, Victor
Author_Institution :
U.S Army Res. Lab., Adelphi, MD, USA
fYear :
2012
fDate :
3-7 June 2012
Firstpage :
354
Lastpage :
357
Abstract :
The silicon carbide SGTO is a future switching component technology of interest to the Army for various pulsed power applications. The research presented in this paper investigates the dV/dt immunity and recovery time (Tq) capability of 1.0 cm2 silicon carbide (SiC) super gate turn-off thyristors (SGTOs). The 1.0 cm2 SiC SGTO is the largest chip based silicon carbide thyristor reported. The SiC SGTO was designed by SPCO and Cree Inc., while the fabrication was done by Cree Inc. This work highlights improved results for both the recovery time and transient voltage immunity compared to the smaller SiC GTO that was previously reported at PPC 2009. The pulse evaluation results in this work show that the SiC SGTO did not require assisted gate turn-off and achieved a recovery time less than 25 μs after a 1-ms wide current pulse current of 1.7 kA, corresponding to an action level of 1.445 × 103 A2s. Finally, the SiC SGTO was evaluated for dV/dt immunity with an instantaneous rise time greater than 9 kV/μs.
Keywords :
silicon compounds; thyristor applications; DV-DT immunity; PPC 2009; SGTO; SPCO; SiC; current 1.7 kA; recovery time capability; silicon carbide; silicon carbide super gate turn-off thyristors; wide current pulse current; device under test; power semiconductor switches; resistance-capacitance; thyristor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Modulator and High Voltage Conference (IPMHVC), 2012 IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-1222-6
Type :
conf
DOI :
10.1109/IPMHVC.2012.6518753
Filename :
6518753
Link To Document :
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