DocumentCode
600893
Title
Spectroscopic observation of micro plasma jets generated by pulsed power
Author
Inokuchi, M. ; Sakugawa, Takashi ; Akiyama, Hidenori
Author_Institution
Grad. Sch. of Sci. & Technol., Kumamoto Univ., Kumamoto, Japan
fYear
2012
fDate
3-7 June 2012
Firstpage
504
Lastpage
507
Abstract
Atmospheric pressure micro plasma jets have been developed for industrial and medical applications, such as the dental treatment, inner surface treatment of capillaries, stimuli of microorganisms and local cleaning of semiconductor devices. An advantage of atmospheric pressure air micro plasma jets is a capability to irradiate plasma to a narrow area, and also is not to require vacuum devices with the ultra-portable and miniaturized size. In this paper, the pulsed power generated micro plasma jets are compared with the DC generated micro plasma jets in gases of air, N2 and O2. Especially, the spectroscopic observation of micro plasma jets is reported comparing two kinds of plasma jets. In the case using the DC power supply, the N2 second positive band, the N2 first positive band, the O radical peak at 777 nm, and NO band of ~300 nm are observed. In the case using the pulsed power source, lines of wavelength between 400 and 600 nm were observed.
Keywords
nitrogen; nitrogen compounds; oxygen; plasma diagnostics; plasma jets; plasma pressure; plasma sources; pulsed power technology; DC generated microplasma jet comparison; N2; N2 first positive band; N2 second positive band; N2 working gas; NO; NO band; O radical peak; O2; O2 working gas; air working gas; atmospheric pressure air microplasma jets; atmospheric pressure microplasma jets; capillary inner surface treatment; dental treatment; microorganism stimulus; microplasma jet spectroscopic observation; plasma irradiation; pulsed power generated microplasma jets; semiconductor device local cleaning; Micro plasma jet; atmosphere; pulsed power; spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Modulator and High Voltage Conference (IPMHVC), 2012 IEEE International
Conference_Location
San Diego, CA
Print_ISBN
978-1-4673-1222-6
Type
conf
DOI
10.1109/IPMHVC.2012.6518791
Filename
6518791
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