DocumentCode
601017
Title
Design of NCL gates with the ASCEnD flow
Author
Moreira, Matheus T. ; Oliveira, C.H.M. ; Porto, R.C. ; Calazans, Ney L. V.
Author_Institution
Fac. of Comput. Sci., Pontifical Catholic Univ. of Rio Grande do Sul, Porto Alegre, Brazil
fYear
2013
fDate
Feb. 27 2013-March 1 2013
Firstpage
1
Lastpage
4
Abstract
Silicon technologies advances brought the possibility of integrating billions of transistors in a die. However, as transistors get smaller, some of the aspects that were negligible in previous technologies emerge as difficulties for the design in current and future technology nodes. In this context, fully synchronous circuits are harder to be built, as timing closure constraints become difficult to be met, and the asynchronous paradigm gains interest in the research community for its ability to cope with current technologies issues. AS-CEnD was proposed as a standard cell library for supporting standard-cell based design of asynchronous circuits and comprises a design flow for asynchronous components. This work presents the use of the ASCEnD flow to design NCL gates, which enable design improvement opportunities for some asynchronous templates. A total of 14 different NCL gates were designed at the layout level and had their electrical behavior characterized. As a result, electrical and physical models of these gates are now part of the ASCEnD library.
Keywords
elemental semiconductors; logic design; logic gates; silicon; transistors; ASCEnD flow; ASCEnD library; NCL gate design; Si; asynchronous circuits; asynchronous components; asynchronous paradigm gains; electrical models; fully synchronous circuits; layout level; physical models; silicon technologies; standard cell library; standard-cell based design; transistors; Adders; Asynchronous circuits; Delays; Layout; Libraries; Logic gates; Transistors; asynchronous circuits; null convention logic; standard cell library;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (LASCAS), 2013 IEEE Fourth Latin American Symposium on
Conference_Location
Cusco
Print_ISBN
978-1-4673-4897-3
Type
conf
DOI
10.1109/LASCAS.2013.6519002
Filename
6519002
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