• DocumentCode
    601025
  • Title

    Novel redundant logic design for noisy low voltage scenarios

  • Author

    Garcia-Leyva, L. ; Calomarde, Antonio ; Moll, Francesc ; Rubio, Albert

  • Author_Institution
    Fac. de Cienc. Basicas, Ing. y Tecnol., Univ. Autonoma de Tlaxcala, Tlaxcala, Mexico
  • fYear
    2013
  • fDate
    Feb. 27 2013-March 1 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The concept worked in this paper named Turtle Logic (TL) is a probabilistic logic method based on port redundancy and complementary data, oriented to emerging CMOS technologies and beyond, where the thermal noise could be predominant and the reliability of the future circuits will be limited. The TL is a technology independent method, which aims to improve tolerance to errors due to noise in single gates, logic and functional units. The TL operation is based on the consistency relation of redundant inputs. In case of discrepancy, the output of the system keeps the previous value. Therefore, it avoids the propagation of incorrect inputs. Simulations show an excellent performance of TL in the presence of large random noise at the inputs with a practical full tolerance to input with a signal to noise ratio of 5dB. Turtle Logic in accordance to Kullback Leibler Distance noise immunity measurement for a NOT gate is approximately 3.6X, 13.4X and 20.9X times better than MRF, DCVS and standard CMOS techniques, respectively, when the gates are operate, with a power supply of 0.15 volts, a temperature of 100 oC and noisy inputs with Additive White Gaussian Noise with zero mean and a standard deviation of 60mV.
  • Keywords
    AWGN; CMOS logic circuits; integrated circuit reliability; logic design; logic gates; CMOS technologies; DCVS; Kullback Leibler Distance noise immunity measurement; MRF; NOT gate; TL operation; additive white Gaussian noise; complementary data; functional units; future circuits reliability; logic units; noisy low voltage scenarios; port redundancy; probabilistic logic method; redundant logic design; signal to noise ratio; single gate units; temperature 100 degC; turtle logic operation; voltage 0.15 V; voltage 60 mV; CMOS integrated circuits; Integrated circuit reliability; Logic gates; Noise; Noise measurement; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (LASCAS), 2013 IEEE Fourth Latin American Symposium on
  • Conference_Location
    Cusco
  • Print_ISBN
    978-1-4673-4897-3
  • Type

    conf

  • DOI
    10.1109/LASCAS.2013.6519010
  • Filename
    6519010