• DocumentCode
    601102
  • Title

    Phase-locked loop simulations using the latency insertion method

  • Author

    Schutt-Aine, J.E. ; Goh, P.K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2013
  • fDate
    Feb. 27 2013-March 1 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper we present a novel and simple behavioral model based simulation method for PLLs. We also demonstrate the use of LIM for simulating PLLs. The methods exploit the latency in the PLL formulation and utilize a leapfrog time-stepping discretization scheme to solve for the transient response of the PLL. Various PLL dynamic responses such as lock-in, pull-in and pull-out conditions are simulated and comparisons with analytical solutions are depicted when available. Due to the formulation in the voltage-phase domain, the method does not suffer from the dual time scale problem which is a main issue in full transistor level simulations of PLLs.
  • Keywords
    phase locked loops; transient response; LIM; PLL dynamic response; PLL formulation; behavioral model-based simulation method; dual-time scale problem; full-transistor level simulations; latency insertion method; leapfrog time-stepping discretization scheme; lock-in pull-in pull-out conditions; phase-locked loop simulations; transient response; voltage-phase domain; Computational modeling; Detectors; Integrated circuit modeling; Mathematical model; Phase locked loops; Tuning; Voltage-controlled oscillators; Phase-locked loop (PLL); simulation; voltage controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (LASCAS), 2013 IEEE Fourth Latin American Symposium on
  • Conference_Location
    Cusco
  • Print_ISBN
    978-1-4673-4897-3
  • Type

    conf

  • DOI
    10.1109/LASCAS.2013.6519090
  • Filename
    6519090