DocumentCode :
601102
Title :
Phase-locked loop simulations using the latency insertion method
Author :
Schutt-Aine, J.E. ; Goh, P.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2013
fDate :
Feb. 27 2013-March 1 2013
Firstpage :
1
Lastpage :
4
Abstract :
In this paper we present a novel and simple behavioral model based simulation method for PLLs. We also demonstrate the use of LIM for simulating PLLs. The methods exploit the latency in the PLL formulation and utilize a leapfrog time-stepping discretization scheme to solve for the transient response of the PLL. Various PLL dynamic responses such as lock-in, pull-in and pull-out conditions are simulated and comparisons with analytical solutions are depicted when available. Due to the formulation in the voltage-phase domain, the method does not suffer from the dual time scale problem which is a main issue in full transistor level simulations of PLLs.
Keywords :
phase locked loops; transient response; LIM; PLL dynamic response; PLL formulation; behavioral model-based simulation method; dual-time scale problem; full-transistor level simulations; latency insertion method; leapfrog time-stepping discretization scheme; lock-in pull-in pull-out conditions; phase-locked loop simulations; transient response; voltage-phase domain; Computational modeling; Detectors; Integrated circuit modeling; Mathematical model; Phase locked loops; Tuning; Voltage-controlled oscillators; Phase-locked loop (PLL); simulation; voltage controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (LASCAS), 2013 IEEE Fourth Latin American Symposium on
Conference_Location :
Cusco
Print_ISBN :
978-1-4673-4897-3
Type :
conf
DOI :
10.1109/LASCAS.2013.6519090
Filename :
6519090
Link To Document :
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