Title :
Performance qualification of instrumentation, telemetry & data acquisition system for underwater mining machine with manganese nodule collection and crushing system
Author :
Muthuvel, P. ; Vishwanath, B.O. ; Ramesh, Ramaswamy ; Jayanthi, K. ; Sasikala, T. ; Rajesh, S. ; Nidhi, V. ; Deepak, C.R. ; Atmanand, M.A.
Author_Institution :
Nat. Inst. of Ocean Technol. (NIOT), Chennai, India
Abstract :
An underwater mining system has been developed for mining polymetallic modules and qualified in shallow water at 512m depth. The mining system has a remotely operable underwater mining machine which collects seabed nodules, crushes and pumps the same through a flexible riser to the mother ship. The machine is equipped with Acoustic Positioning system, Altimeter, Doppler Velocity Log (DVL), Proximity sensors, Linear Variable Differential Transformer (LVDT), Pressure, Temperature, Motion Reference Unit (MRU), Underwater Camera and lamps for various measurement and operation of underwater mining machine. The machine was tested at Angira Bank off Malvan coast during Oct 2010. This paper presents the details of performance of various underwater sensors, Telemetry & Data Acquisition system at 512m depth. Based on the results from the tests, the next phase of 6000m operations is being attempted.
Keywords :
altimeters; cameras; crushers; data acquisition; marine telemetry; mining equipment; DVL; Doppler velocity log; LVDT; MRU; acoustic positioning system; altimeter; crushing system; data acquisition system; depth 6000 m; instrumentation system; lamps; linear variable differential transformer; manganese nodule collection; mining polymetallic modules; motion reference unit; proximity sensors; remotely operable underwater mining machine; telemetry system; underwater camera; underwater mining machine; Data acquisition; Data mining; Electric shock; Instruments; Marine vehicles; Sensors; Vibrations; Data Acquisition; Telemetry and Transducers; Underwater Mining Machine;
Conference_Titel :
Underwater Technology Symposium (UT), 2013 IEEE International
Conference_Location :
Tokyo
Print_ISBN :
978-1-4673-5948-1
DOI :
10.1109/UT.2013.6519871
