• DocumentCode
    601496
  • Title

    A dual-channel isolated resonant gate driver for low gate drive loss in ZVS Full-bridge converters

  • Author

    Zhiliang Zhang ; Fei-Fei Li ; Fanghua Zhang ; Yan-Fei Liu

  • Author_Institution
    Jiangsu Key Lab. of New Energy Generation & Power Conversion, Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
  • fYear
    2013
  • fDate
    17-21 March 2013
  • Firstpage
    31
  • Lastpage
    37
  • Abstract
    As the switching frequency increases, to reduce the gate drive loss combined with the Zero-Voltage-Switching (ZVS) technique is meaningful for the widely used Full-Bridge (FB) converters. A dual-channel isolated Resonant Gate Driver (RGD) is proposed in this paper. The proposed RGD is able to provide two isolated complementary drive signals for two power MOSFETs in one bridge leg. Furthermore, the proposed RGD reduces about 79% gate drive loss compared to the conventional Voltage Source Driver (VSD). In addition, the negative gate drive voltage provided by the proposed RGD prevents the false trigger problem. The optimum design of the proposed RGD is given in detail. A 200-VDC input, 48-V/20-A output and 500-kHz phase-shift ZVS FB converter with the proposed RGD was built to verify the advantage and efficiency improvement.
  • Keywords
    driver circuits; phase convertors; power MOSFET; resonant power convertors; switching convertors; zero voltage switching; RGD; VSD; ZVS full-bridge converters; bridge leg; current 20 A; dual-channel isolated resonant gate driver; false trigger problem; frequency 500 kHz; isolated complementary drive signals; low gate drive loss; negative gate drive voltage; phase-shift ZVS FB converter; power MOSFET; switching frequency; voltage 200 V; voltage 48 V; voltage source driver; zero-voltage-switching technique; Full-Bridge (FB); Resonant Gate Driver (RGD); Zero-Voltage Switching (ZVS); power MOSFET;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
  • Conference_Location
    Long Beach, CA
  • ISSN
    1048-2334
  • Print_ISBN
    978-1-4673-4354-1
  • Electronic_ISBN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.2013.6520181
  • Filename
    6520181