DocumentCode :
601570
Title :
Enhanced shielded-gate trench MOSFETs for high-frequency, high-efficiency computing power supply applications
Author :
Sarkar, Tamal ; Challa, A. ; Sapp, Steven
Author_Institution :
Device Design & Modeling, Fairchild Semicond., Pune, India
fYear :
2013
fDate :
17-21 March 2013
Firstpage :
507
Lastpage :
511
Abstract :
Shielded-gate trench-MOSFETs yield superior performance compared to conventional gate trench devices by allowing higher doping density in the drift region and providing a `shielding effect´ for the gate by placing an intermediate electrode between gate and drain. However, further design optimizations can be done for a shielded-gate trench-MOSFET to improve performance parameters particularly suited for next-generation high-frequency computing power supply applications and they have been outlined in this article. Channel length and threshold voltage optimization, substrate thinning and intrinsic gate resistance reduction (by layout enhancements) have been discussed along with their impact on device footprint reduction. Further, effects of these design optimizations on the power loss and efficiency of a high-frequency switching converter have been demonstrated through experimental characterizations.
Keywords :
MOSFET; isolation technology; power supply circuits; semiconductor doping; shielding; channel length; conventional gate trench devices; design optimizations; device footprint reduction; doping density; drift region; enhanced shielded-gate trench MOSFET; experimental characterizations; high-efficiency computing power supply applications; high-frequency switching converter; intrinsic gate resistance reduction; layout enhancements; next-generation high-frequency computing power supply applications; performance parameters; power loss; shielded-gate trench-MOSFET; shielding effect; substrate thinning; threshold voltage optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
Conference_Location :
Long Beach, CA
ISSN :
1048-2334
Print_ISBN :
978-1-4673-4354-1
Electronic_ISBN :
1048-2334
Type :
conf
DOI :
10.1109/APEC.2013.6520257
Filename :
6520257
Link To Document :
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