Switching performance improvement of IGBT modules using an active gate driver

This paper addresses the issues of switching behavior of a high power insulated gate bipolar transistor (IGBT) that works in hard switching conditions. First, the voltage and current switching waveforms of IGBT modules are described for an IGBT phase-leg module with an inductive load, and the associated switching losses, reverse recovery current of free-wheeling diodes, voltage overshoot, and EMI noise are analyzed. Based on the analysis, an actively controlled gate drive circuit is proposed, which provides optimization of the fast driving for low switching losses and short switching time, and slow driving for low noise and switching stress. Compared to a conventional gate drive strategy, the proposed active gate driver (AGD) has the capability of reducing the switching losses, delay time, and Miller plateau duration effectively during both turn-on and turn-off transient. Experimental results verify the validity and effectiveness of the proposed gate driving method.