DocumentCode :
601756
Title :
High-temperature SOI-based gate driver IC for WBG power switches
Author :
Greenwell, R.L. ; McCue, Benjamin M. ; Tolbert, Leon M. ; Blalock, Benjamin J. ; Islam, Syed K.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
fYear :
2013
fDate :
17-21 March 2013
Firstpage :
1768
Lastpage :
1775
Abstract :
High-temperature integrated circuits fill a need in applications where there are obvious benefits to reduced thermal management or where circuitry is placed away from temperature extremes. Examples of these applications include aerospace, automotive, power generation, and well-logging. This work focuses on automotive applications in which the growing demand for hybrid electric vehicles (HEVs), Plug-in-hybrids (PHEVs), and Fuel-cell vehicles (FCVs) has increased the need for high-temperature electronics that can operate at the extreme ambient temperatures that exist under the hood of these vehicles, which can be in excess of 150°C. Silicon carbide (SiC) and other wide-bandgap power switches that can function at these temperature extremes are now entering the market. To take full advantage of their potential, high-temperature capable circuits that can also operate in these environments are required.
Keywords :
automotive electronics; driver circuits; fuel cell vehicles; high-temperature electronics; hybrid electric vehicles; silicon compounds; silicon-on-insulator; switches; FCV; HEV; PHEV; SiC; WBG power switches; aerospace applications; automotive applications; fuel-cell vehicles; high-temperature SOI-based gate driver IC; high-temperature capable circuits; high-temperature electronics; high-temperature integrated circuits; hybrid electric vehicles; plug-in-hybrids; power generation; temperature 150 degC; temperature extremes; thermal management; well-logging; wide-bandgap power switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
Conference_Location :
Long Beach, CA
ISSN :
1048-2334
Print_ISBN :
978-1-4673-4354-1
Electronic_ISBN :
1048-2334
Type :
conf
DOI :
10.1109/APEC.2013.6520535
Filename :
6520535
Link To Document :
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