DocumentCode :
601817
Title :
The impact of high-voltage and fast-switching devices on modular multilevel converters
Author :
Guzman P, D.A. ; Balda, Juan Carlos
Author_Institution :
Dept. of Electr. Eng., Univ. of Arkansas, Fayetteville, AR, USA
fYear :
2013
fDate :
17-21 March 2013
Firstpage :
2171
Lastpage :
2177
Abstract :
US government is funding the development of high-voltage and fast-switching power semiconductor devices based on silicon carbide (SiC) for applications in medium- and high-voltage power systems. The availability of these devices should reduce the complexities of grid-connected advanced power electronic systems like medium-voltage voltage-source converters (VSC) for HVDC terminals, power electronic interfaces for distributed generation, or high-power motor drives. However, fast-switching devices may augment the adverse effects of parasitic inductances that are inherent in any power converter layout. Hence, this paper presents a theoretical analysis of the impacts that the developing 15-kV SiC insulated gate bipolar transistors (IGBTs) have on modular multilevel converters (MMCs) in terms of the sub-module (SM) numbers, the SM capacitance, the effects of parasitic inductances on overvoltages, capacitor and IGBT module volumes, and THD. An 800 MW ±320 kV VSC-HVDC terminal is selected as a case study to illustrate the potential advantages of such a high-voltage and fast-switching semiconductor device.
Keywords :
high-voltage engineering; insulated gate bipolar transistors; power semiconductor devices; silicon compounds; adverse effects; fast-switching semiconductor device; grid-connected advanced power electronic systems; high-voltage fast-switching devices; high-voltage semiconductor device; insulated gate bipolar transistors; modular multilevel converters; potential advantages; power electronic interfaces; power semiconductor devices; silicon carbide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE
Conference_Location :
Long Beach, CA
ISSN :
1048-2334
Print_ISBN :
978-1-4673-4354-1
Electronic_ISBN :
1048-2334
Type :
conf
DOI :
10.1109/APEC.2013.6520596
Filename :
6520596
Link To Document :
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