DocumentCode
60193
Title
Data Quality: Some Comments on the NASA Software Defect Datasets
Author
Shepperd, Martin ; Qinbao Song ; Zhongbin Sun ; Mair, C.
Author_Institution
Dept. of IS & Comput., Brunel Univ., Uxbridge, UK
Volume
39
Issue
9
fYear
2013
fDate
Sept. 2013
Firstpage
1208
Lastpage
1215
Abstract
Background--Self-evidently empirical analyses rely upon the quality of their data. Likewise, replications rely upon accurate reporting and using the same rather than similar versions of datasets. In recent years, there has been much interest in using machine learners to classify software modules into defect-prone and not defect-prone categories. The publicly available NASA datasets have been extensively used as part of this research. Objective--This short note investigates the extent to which published analyses based on the NASA defect datasets are meaningful and comparable. Method--We analyze the five studies published in the IEEE Transactions on Software Engineering since 2007 that have utilized these datasets and compare the two versions of the datasets currently in use. Results--We find important differences between the two versions of the datasets, implausible values in one dataset and generally insufficient detail documented on dataset preprocessing. Conclusions--It is recommended that researchers 1) indicate the provenance of the datasets they use, 2) report any preprocessing in sufficient detail to enable meaningful replication, and 3) invest effort in understanding the data prior to applying machine learners.
Keywords
data analysis; learning (artificial intelligence); pattern classification; software reliability; IEEE Transactions on Software Engineering; NASA software defect dataset; National Aeronautics and Space Administration; data preprocessing; data quality; data replication; dataset provenance; defect-prone classification; machine learning; not-defect-prone classification; software module classification; Abstracts; Communities; Educational institutions; NASA; PROM; Software; Sun; Empirical software engineering; data quality; defect prediction; machine learning;
fLanguage
English
Journal_Title
Software Engineering, IEEE Transactions on
Publisher
ieee
ISSN
0098-5589
Type
jour
DOI
10.1109/TSE.2013.11
Filename
6464273
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