• DocumentCode
    602360
  • Title

    Sintered silver (Ag) as lead-free die attach materials

  • Author

    Siow, K.S.

  • Author_Institution
    Package Innovation Dev. Centre, SCG Ind. Malaysia Sdn Bhd, Seremban, Malaysia
  • fYear
    2012
  • fDate
    6-8 Nov. 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper documents the feasibility study of using micrometer-scale Ag paste as a lead-free (Pb-free) die attach material for microelectronic packaging. Currently, there is no viable Pb-free die attach in the market which can pass the reliability testing regimen. Sintered Ag was explored as an interconnect material because of its relatively low processing temperature and robust joint after sintered. This report suggests a possible route for using Ag paste as a Pb-free die attach by dispensing as per current production epoxy die attach. This feasibility study reports the mechanical integrity, electrical and reliability testing of a surface mount power package with four types of dispensable Ag pastes. Separate lots of this surface-mount power package with current die attach materials were also evaluated as controls. This paper is expected to be of interest to companies that are exploring alternative Pb-free die attach materials.
  • Keywords
    integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; silver; sintering; surface mount technology; Ag; dispensable pastes; electrical testing; interconnect material; lead-free die attach materials; low processing temperature; mechanical integrity; microelectronic packaging; micrometer-scale paste; per current production epoxy die attach; reliability testing; reliability testing regimen; robust joint; surface mount power package; Pb-free die attach; sintered Ag joint;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
  • Conference_Location
    Ipoh
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4673-4384-8
  • Electronic_ISBN
    1089-8190
  • Type

    conf

  • DOI
    10.1109/IEMT.2012.6521795
  • Filename
    6521795