DocumentCode
602360
Title
Sintered silver (Ag) as lead-free die attach materials
Author
Siow, K.S.
Author_Institution
Package Innovation Dev. Centre, SCG Ind. Malaysia Sdn Bhd, Seremban, Malaysia
fYear
2012
fDate
6-8 Nov. 2012
Firstpage
1
Lastpage
6
Abstract
This paper documents the feasibility study of using micrometer-scale Ag paste as a lead-free (Pb-free) die attach material for microelectronic packaging. Currently, there is no viable Pb-free die attach in the market which can pass the reliability testing regimen. Sintered Ag was explored as an interconnect material because of its relatively low processing temperature and robust joint after sintered. This report suggests a possible route for using Ag paste as a Pb-free die attach by dispensing as per current production epoxy die attach. This feasibility study reports the mechanical integrity, electrical and reliability testing of a surface mount power package with four types of dispensable Ag pastes. Separate lots of this surface-mount power package with current die attach materials were also evaluated as controls. This paper is expected to be of interest to companies that are exploring alternative Pb-free die attach materials.
Keywords
integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; silver; sintering; surface mount technology; Ag; dispensable pastes; electrical testing; interconnect material; lead-free die attach materials; low processing temperature; mechanical integrity; microelectronic packaging; micrometer-scale paste; per current production epoxy die attach; reliability testing; reliability testing regimen; robust joint; surface mount power package; Pb-free die attach; sintered Ag joint;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location
Ipoh
ISSN
1089-8190
Print_ISBN
978-1-4673-4384-8
Electronic_ISBN
1089-8190
Type
conf
DOI
10.1109/IEMT.2012.6521795
Filename
6521795
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