DocumentCode :
602381
Title :
Removal of flux residues from highly dense assemblies
Author :
Bixenman, M. ; Chan, Jeffrey ; Loy, T.C.
fYear :
2012
fDate :
6-8 Nov. 2012
Firstpage :
1
Lastpage :
9
Abstract :
Quality and reliability is a function of the manufacturing design that achieves repeatability and reproducibility. Designing advanced packages and assemblies is more difficult due to lead-free wetting and higher process temperature requirements. The associated manufacturing changes along with component miniaturization and board density increases complexity. From a cleaning perspective, many designers have poor insight into factors that assure a cleanable design. Solder paste selection, reflow conditions, component placement, component clearance (standoff), cleaning agent and cleaning equipment are important factors. Collaboration between process engineers, assembly designers, solder materials, cleaning agent and cleaning equipment experts can improve integration of the circuit design and assembly. Package design plays an important role when cleaning is required. Density of components, component layout, thermal heat requirements, and standoff height/clearance are key considerations. From a cleanability perspective, package on package, flip chip, bottom termination component (BTC) selection, solder mask definition, placement and layout influence the clearance gaps. The purpose of this research is to use a BTC test vehicle for studying factors related to the cleaning process. The designed experiment will present findings for removing flux residues under bottom termination components.
Keywords :
assembling; cleaning; flip-chip devices; reliability; solders; BTC selection; BTC test vehicle; board density; bottom termination component selection; circuit assembly; circuit design; cleaning agent; cleaning equipment; cleaning process; component clearance; component placement; flip chip; flux residue removal; lead-free wetting; manufacturing design; package design; package on package; reflow conditions; reliability; solder mask definition; solder materials; solder paste selection; thermal heat;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2012 35th IEEE/CPMT International
Conference_Location :
Ipoh
ISSN :
1089-8190
Print_ISBN :
978-1-4673-4384-8
Electronic_ISBN :
1089-8190
Type :
conf
DOI :
10.1109/IEMT.2012.6521836
Filename :
6521836
Link To Document :
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