DocumentCode
602608
Title
Adaptive Reliability Chipkill Correct (ARCC)
Author
Xun Jian ; Kumar, Ravindra
Author_Institution
Univ. of Illinois at Urbana Champaign, Champaign, IL, USA
fYear
2013
fDate
23-27 Feb. 2013
Firstpage
270
Lastpage
281
Abstract
Chipkill correct is an advanced type of error correction in memory that is popular among servers. Large field studies of memories have shown that chipkill correct reduces uncorrectable error rate by 4X [11] to 36X [12] compared to SECDED. Currently, there is a strong trade-off between power and reliability among different chipkill correct solutions. For example, commercially available chipkill correct solutions that can detect up to two failed devices and correct one (eg. SCCDCD) or two (eg. Double Chip Sparing) failed devices require accessing 36 DRAM devices per memory request. However, a weaker single chipkill correct single chipkill detect solution only requires accessing 18 devices per memory request and, therefore consumes much lower memory power. In this paper, we present Adaptive Reliability Chipkill Correct (ARCC) - an optimization to be applied to existing chipkill correct solutions to allow them to incur the low power consumption of a lower strength chipkill correct solution while maintaining similar reliability as that of a stronger chipkill correct solution. ARCC is based on the observation that, on average, only a tiny fraction of memory experiences any type of faults during the typical operational lifespan of a server. As such, it proposes relaxing the strength of chipkill correct in the beginning and then adaptively increasing the strength as needed on a page by page basis in order to reap the benefit of lower power consumption during the majority of the lifetime of a memory system. Our evaluation shows that ARCC reduces the power consumption of memory by 36%, on average, when applied to commercial SCCDCD, while keeping the storage overhead the same and maintaining similar reliability.
Keywords
DRAM chips; microprocessor chips; power aware computing; ARCC; DRAM devices; SCCDCD; SECDED; adaptive reliability chipkill correct; double chip sparing; error correction; failed devices; memory power; memory system; power consumption; Circuit faults; Error correction; Error correction codes; Memory management; Power demand; Reliability; Servers;
fLanguage
English
Publisher
ieee
Conference_Titel
High Performance Computer Architecture (HPCA2013), 2013 IEEE 19th International Symposium on
Conference_Location
Shenzhen
ISSN
1530-0897
Print_ISBN
978-1-4673-5585-8
Type
conf
DOI
10.1109/HPCA.2013.6522325
Filename
6522325
Link To Document