• DocumentCode
    602669
  • Title

    A 5 Gb/s 1/4-rate clock and data recovery circuit using dynamic stepwise bang-bang phase detector

  • Author

    Yen-Long Lee ; Soon-Jyh Chang ; Rong-Sing Chu ; Ying-Zu Lin ; Yen-Chi Chen ; Goh Jih Ren ; Chung-Ming Huang

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng-Kung Univ., Tainan, Taiwan
  • fYear
    2012
  • fDate
    12-14 Nov. 2012
  • Firstpage
    141
  • Lastpage
    144
  • Abstract
    This paper presents a 5-Gb/s 1/4-rate clock and data recovery (CDR) circuit. The proposed dynamic stepwise bang-bang phase detector comprises the advantage of linear and bang-bang phase detectors. The CDR adjusts the charge pump currents and the interpolation weight of phase interpolators according to the phase error between input data and feedback clock. This CDR circuit was fabricated in TSMC 1P9M 90-nm CMOS technology. It consumes 16.8 mW from a 1.2-V supply and occupies an active area of 0.3 mm2. The measured peak-to-peak jitter and rms jitter of the recovered clock are 42.37 ps and 7.06 ps for a 5-Gb/s 27-1 PRBS, respectively. Moreover, the measured peak-to-peak jitter and rms jitter of the recovered data are 53.33 ps and 8.89 ps for a 5-Gb/s 27-1 PRBS, respectively.
  • Keywords
    CMOS digital integrated circuits; charge pump circuits; clock and data recovery circuits; interpolation; jitter; phase detectors; CDR circuit; TSMC CMOS technology; bit rate 5 Gbit/s; charge pump currents; clock and data recovery circuit; dynamic stepwise bang-bang phase detector; feedback clock; linear phase detector; measured peak-to-peak jitter; phase error; phase interpolator interpolation weight; power 16.8 mW; rms jitter; size 90 nm; time 42.37 ps; time 53.33 ps; time 7.06 ps; time 8.89 ps; voltage 1.2 V;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference (A-SSCC), 2012 IEEE Asian
  • Conference_Location
    Kobe
  • Type

    conf

  • DOI
    10.1109/IPEC.2012.6522645
  • Filename
    6522645