Title :
Inter-Stage Gain Error self-calibration of a 31.5fJ 10b 470MS/S Pipelined-SAR ADC
Author :
Jianyu Zhong ; Yan Zhu ; Sai-Weng Sin ; Seng-Pan, U. ; Martins, Rui P.
Author_Institution :
State-Key Lab. of Analog & Mixed Signal VLSI, Univ. of Macau, Macao, China
Abstract :
This paper proposes an Inter-Stage Gain Error (ISGE) calibration method devoted to correct the residue gain errors induced by the parasitic effects, non-ideal op-amp gain and capacitor mismatch, and also the mismatches for supply-derived reference voltages between two stages for Pipelined-SAR ADC. The calibration reuses the SAR ADC to estimate the overall inter-stage gain error and compensates it in the 2nd-stage DAC in 2 cycles, and it is implemented in a Pipelined-SAR which achieves 10b 470 MS/s in 65 nm CMOS with the FoM of 31.5 fJ/conv.-step by consuming only 6% of the total ADC area (0.049 mm2).
Keywords :
CMOS digital integrated circuits; analogue-digital conversion; digital-analogue conversion; operational amplifiers; CMOS technology; ISGE calibration method; capacitor mismatch; interstage gain error self-calibration; nonideal op-amp gain; parasitic effects; pipelined-SAR ADC; residue gain errors; second-stage DAC; size 65 nm; supply-derived reference mismatch;
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2012 IEEE Asian
Conference_Location :
Kobe
DOI :
10.1109/IPEC.2012.6522648