Title :
A 0.7 V-to-1.0V 10.1 dBm-to-13.2 dBm 60-GHz power amplifier using digitally-assisted LDO considering HCI issues
Author :
Rui Wu ; Tsukui, Y. ; Minami, Ryutaro ; Okada, Kenichi ; Matsuzawa, Akira
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
A 60-GHz power amplifier (PA) with consideration of hot-carrier-induced (HCI) degradation is presented. The supply voltage of the last stage of the PA (VPA) is dynamically controlled by an on-chip digitally-assisted low drop-out voltage regulator (LDO) to alleviate HCI effects. The PA is fabricated in a standard 65-nm CMOS process with a core area of 0.21 mm2, which provides a saturation power of 10.1 dBm to 13.2 dBm with a peak power-added efficiency (PAE) of 8.1% to 15.0% for PA varying from 0.7V to 1.0V at 60 GHz, respectively.
Keywords :
CMOS analogue integrated circuits; hot carriers; power amplifiers; voltage regulators; CMOS process; HCI degradation; HCI effects; PAE; VPA; digitally-assisted LDO; frequency 60 GHz; hot-carrier-induced degradation; on-chip digitally-assisted low drop-out voltage regulator; power amplifier; power-added efficiency; saturation power; size 65 nm; supply voltage; voltage 0.7 V to 1.0 V;
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2012 IEEE Asian
Conference_Location :
Kobe
DOI :
10.1109/IPEC.2012.6522677