Title :
Development of low temperature curable positive tone photosensitive dielectric material
Author :
Tanimoto, Akira ; Abe, Kiyohiko ; Nobe, Shigeru ; Matsutani, Hiroshi
Author_Institution :
Tsukuba Res. Lab., Hitachi Chem. Co., Ltd., Tsukuba, Japan
Abstract :
Recently, low temperature curable photosensitive dielectric materials are attracting much attention in semiconductor package application to avoid thermal damages of the semiconductor devices. AH-1000 is a low temperature curable positive tone photo- definable material. In this paper, we report the mechanical, thermal, and adhesion property of AH-1000 together with its chemical resistance. A wafer level package (WLP) using AH-1000 as redistribution layers indicates that AH-1000 has enough mechanical toughness. It also suggests that higher elongation and lower Young´s modulus are effective to eliminate mechanical stress to solder balls for dielectrics.
Keywords :
Young´s modulus; dielectric materials; semiconductor device packaging; solders; thermal management (packaging); wafer level packaging; AH-1000; WLP; Young´s modulus; adhesion property; chemical resistance; dielectrics; elongation; low temperature curable photosensitive dielectric material; mechanical property; mechanical stress; mechanical toughness; positive tone photosensitive dielectric material; semiconductor device thermal damage; semiconductor package; solder balls; thermal property; wafer level package;
Conference_Titel :
CPMT Symposium Japan, 2012 2nd IEEE
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-2654-4
DOI :
10.1109/ICSJ.2012.6523450