DocumentCode
602798
Title
Impact of energy relaxation time on heat generation in silicon with electro-thermal analysis
Author
Hatakeyama, T. ; Kibushi, Risako ; Ishizuka, M.
Author_Institution
Toyama Prefectural Univ., Imizu, Japan
fYear
2012
fDate
10-12 Dec. 2012
Firstpage
1
Lastpage
3
Abstract
This paper describes heat generation in semiconductor depending on energy relaxation time between electron and lattice. Recently, power semiconductor devices are widely used in several areas, for example car electronics. Heat generation density in electrical devices has been increased with downsizing electrical devices. Then, thermal management of semiconductor devices is becoming key issue for further development of electrical devices. In this paper, estimation of heat generation in silicon under high electric filed was focused. Under high electric field, electron energy (electron temperature) becomes much higher than lattice energy (lattice temperature). Therefore, electro-thermal analysis was employed to consider non-equilibrium state between electron temperature and lattice temperature. Energy relaxation time between electron and lattice was varied as parameter and impact of energy relaxation time on estimated heat generation density was discussed.
Keywords
elemental semiconductors; power semiconductor devices; silicon; thermal management (packaging); Si; car electronics; electric filed; electrical devices; electro-thermal analysis; electron energy; electron temperature; energy relaxation time; heat generation density; heat generation estimation; lattice energy; lattice temperature; non-equilibrium state; power semiconductor devices; thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
CPMT Symposium Japan, 2012 2nd IEEE
Conference_Location
Kyoto
Print_ISBN
978-1-4673-2654-4
Type
conf
DOI
10.1109/ICSJ.2012.6523473
Filename
6523473
Link To Document