DocumentCode :
602887
Title :
Temperature aware thread migration in 3D architecture with stacked DRAM
Author :
Dali Zhao ; Homayoun, Houman ; Veidenbaum, A.V.
Author_Institution :
Univ. of California, Irvine, Irvine, CA, USA
fYear :
2013
fDate :
4-6 March 2013
Firstpage :
80
Lastpage :
87
Abstract :
A 3D architecture with DRAM memory stacked on a multi-core processor has many benefits for the embedded system. Compared with a conventional 2D design, it reduces memory access latency, increases memory bandwidth and reduces energy consumption. However it poses a thermal challenge as the heat generated by the processor cannot dissipate efficiently through the DRAM memory layer. Due to the fact that DRAM is very sensitive to high temperature as well as temperature variance, 3D stacking causes more failures to occur because DRAM thermal variance is higher than the conventional 2D architecture. To address this thermal challenge we propose to reduce temperature variance and peak temperature of a 3D multi-core processor and stacked DRAM by thermally aware thread migration among processor cores. This method has very limited impact on processor performance. Using migration-based policy we reduce peak steady-state temperature in the processor by up to 8.3 degrees Celsius, with the average of 4.7 degrees.
Keywords :
DRAM chips; embedded systems; multiprocessing systems; three-dimensional integrated circuits; 2D architecture; 2D design; 3D architecture; 3D multicore processor; 3D stacking; DRAM memory layer; DRAM thermal variance; embedded system; energy consumption; memory access latency; memory bandwidth; migration based policy; processor core; stacked DRAM memory; steady state temperature; temperature aware thread migration; temperature variance; Context; Heuristic algorithms; Multicore processing; Random access memory; Temperature sensors; Three-dimensional displays; 3D architecture; Thermal Management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2013 14th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4673-4951-2
Type :
conf
DOI :
10.1109/ISQED.2013.6523594
Filename :
6523594
Link To Document :
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