• DocumentCode
    602910
  • Title

    Crosstalk timing windows overlap in statistical static timing analysis

  • Author

    Fatemi, H. ; Tehrani, P.

  • Author_Institution
    Synopsys, Inc., Mountain View, CA, USA
  • fYear
    2013
  • fDate
    4-6 March 2013
  • Firstpage
    245
  • Lastpage
    251
  • Abstract
    Process variation can have significant impact on device and interconnect performance, especially in the presence of crosstalk. A key technique to reduce crosstalk analysis pessimism is to consider timing window overlap of electrically coupled signals. SSTA timing windows tend to be larger than their corner counterparts resulting in pessimistic timing window overlap analysis, hence overestimating crosstalk impact. This paper describes an efficient method to remove die-to-die as well as common portion of within-die pessimism of the timing window overlap analysis. This approach has been implemented in an industrial timing analysis tool and experimental results show significant accuracy improvement and pessimism reduction compared to the existing techniques.
  • Keywords
    crosstalk; integrated circuit interconnections; statistical analysis; timing circuits; SSTA timing windows; crosstalk analysis pessimism; crosstalk impact; crosstalk timing windows overlap; device performance; electrically coupled signals; industrial timing analysis tool; interconnect performance; pessimistic timing window overlap analysis; process variation; statistical static timing analysis; within-die pessimism; Correlation; Crosstalk; Delays; Equations; Mathematical model; Random variables;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2013 14th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-4951-2
  • Type

    conf

  • DOI
    10.1109/ISQED.2013.6523617
  • Filename
    6523617