• DocumentCode
    602924
  • Title

    Suspicious timing error prediction with in-cycle clock gating

  • Author

    Youhua Shi ; Igarashi, H. ; Togawa, N. ; Yanagisawa, M.

  • Author_Institution
    Waseda Univ., Tokyo, Japan
  • fYear
    2013
  • fDate
    4-6 March 2013
  • Firstpage
    335
  • Lastpage
    340
  • Abstract
    Conventionally, circuits are designed to add pessimistic timing margin to solve delay variation problems, which guarantees “always correct” operations. However, due to the fact that such a worst-case condition occurs rarely, the traditional pessimistic design method is therefore becoming one of the main obstacles for designers to achieve higher performance and/or ultra-low power consumption. By monitoring timing error occurrence during circuit operation, adaptive timing error detection and recovery methods have gained wide interests recently as a promising solution. As an extension of existing research, in this paper, we propose a suspicious timing error prediction method for performance or energy efficiency improvement in pipeline designs. Experimental results show that with when compared with typical margin designs, the proposed method can 1) achieve up to 1.41X throughput improvement with in-situ timing error prediction ability; and 2) allow the design to be overclocked by up to 1.88X with “always correct” outputs.
  • Keywords
    VLSI; error detection; integrated circuit design; VLSI designs; adaptive timing error detection method; adaptive timing error recovery methods; delay variation problems; energy efficiency; in-cycle clock gating; pessimistic design method; pessimistic timing margin; pipeline designs; suspicious timing error prediction; ultralow power consumption; Clocks; Delays; Flip-flops; Monitoring; Pipelines; Throughput; Timing error prediction; clock gating; robust design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2013 14th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-4951-2
  • Type

    conf

  • DOI
    10.1109/ISQED.2013.6523631
  • Filename
    6523631