DocumentCode
602924
Title
Suspicious timing error prediction with in-cycle clock gating
Author
Youhua Shi ; Igarashi, H. ; Togawa, N. ; Yanagisawa, M.
Author_Institution
Waseda Univ., Tokyo, Japan
fYear
2013
fDate
4-6 March 2013
Firstpage
335
Lastpage
340
Abstract
Conventionally, circuits are designed to add pessimistic timing margin to solve delay variation problems, which guarantees “always correct” operations. However, due to the fact that such a worst-case condition occurs rarely, the traditional pessimistic design method is therefore becoming one of the main obstacles for designers to achieve higher performance and/or ultra-low power consumption. By monitoring timing error occurrence during circuit operation, adaptive timing error detection and recovery methods have gained wide interests recently as a promising solution. As an extension of existing research, in this paper, we propose a suspicious timing error prediction method for performance or energy efficiency improvement in pipeline designs. Experimental results show that with when compared with typical margin designs, the proposed method can 1) achieve up to 1.41X throughput improvement with in-situ timing error prediction ability; and 2) allow the design to be overclocked by up to 1.88X with “always correct” outputs.
Keywords
VLSI; error detection; integrated circuit design; VLSI designs; adaptive timing error detection method; adaptive timing error recovery methods; delay variation problems; energy efficiency; in-cycle clock gating; pessimistic design method; pessimistic timing margin; pipeline designs; suspicious timing error prediction; ultralow power consumption; Clocks; Delays; Flip-flops; Monitoring; Pipelines; Throughput; Timing error prediction; clock gating; robust design;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2013 14th International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1948-3287
Print_ISBN
978-1-4673-4951-2
Type
conf
DOI
10.1109/ISQED.2013.6523631
Filename
6523631
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