DocumentCode :
602935
Title :
Manufacturable nanometer designs using standard cells with regular layout
Author :
Subramaniyan, Kasyab P. ; Larsson-Edefors, Per
Author_Institution :
Dept. of Comput. Sci. & Eng., Chalmers Univ. of Technol., Gothenburg, Sweden
fYear :
2013
fDate :
4-6 March 2013
Firstpage :
398
Lastpage :
405
Abstract :
In addition to performance considerations, designing VLSI circuits at nanometer-scale process technology nodes demands considerations related to manufacturability and cost. Regular layout patterns are known to enhance resilience to random as well as certain types of systematic variations. In this contribution we assess the implications of this layout regularity using design automation for Critical Feature Analysis (CFA) and raw metrics, such as via count. Using the ISCAS´89 benchmark suite, for each benchmark circuit we compare place-and-route implementations that are based on semi-regular and ultra-regular cell layouts. While the CFA counter-intuitively suggests that implementations using ultra-regular layouts have lower Design for Manufacturability (DFM) scores than those using semi-regular layouts, we find that ultra-regular layouts yield implementations with an average of 22% fewer vias at the cost of a small wire length increase.
Keywords :
VLSI; design for manufacture; integrated circuit layout; integrated circuit manufacture; nanoelectronics; CFA; DFM; ISCAS´89 benchmark circuit; VLSI circuit design; critical feature analysis; design automation; design for manufacturability; manufacturable nanometer designs; nanometer-scale process technology nodes; regular layout; regular layout patterns; semiregular cell layouts; small wire length; ultraregular cell layouts; Benchmark testing; Geometry; Layout; Libraries; Logic gates; Measurement; Standards; DFM; Lithography; Manufacturability; Regular Fabrics; Regularity; Standard Cells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2013 14th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4673-4951-2
Type :
conf
DOI :
10.1109/ISQED.2013.6523642
Filename :
6523642
Link To Document :
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