DocumentCode :
602965
Title :
Multi-trap RTN parameter extraction based on Bayesian inference
Author :
Awano, Hiromitsu ; Tsutsui, H. ; Ochi, Hiroshi ; Sato, Takao
Author_Institution :
Dept. of Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
fYear :
2013
fDate :
4-6 March 2013
Firstpage :
597
Lastpage :
602
Abstract :
This paper presents a new analysis method for estimating the statistical parameters of random telegraph noise (RTN). RTN is characterized by the time constants of carrier capture and emission, and associated changes of threshold voltage. Because trap activities are projected on to the threshold voltage, the separation of time constants and amplitude for each trap is an ill-posed problem. The proposed method solves this problem by statistical method that can reflect the physical generation process of RTN. By using Gibbs sampling algorithm developed in statistical machine learning community, we decompose the measured threshold voltage sequence to time constants and amplitude of each trap. We also demonstrate that the proposed method estimates time constants about 2.1 times more accurately than the existing work that uses hidden Markov model, which contributes to enhance the accuracy of reliability-aware circuit simulation.
Keywords :
belief networks; circuit simulation; inference mechanisms; integrated circuit reliability; learning (artificial intelligence); parameter estimation; random noise; sampling methods; semiconductor device noise; Bayesian inference; Gibbs sampling algorithm; carrier capture; carrier emission; ill-posed problem; multitrap RTN parameter extraction; random telegraph noise; reliability-aware circuit simulation accuracy enhancement; statistical machine learning; statistical method; statistical parameter estimation; threshold voltage sequence decomposition; time constant estimation; Bayes methods; Electron traps; Hidden Markov models; Noise; Threshold voltage; Time measurement; Voltage measurement; Bayesian estimation; Device characterization; Random Telegraph Noise; Separation of multitrap activity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2013 14th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4673-4951-2
Type :
conf
DOI :
10.1109/ISQED.2013.6523672
Filename :
6523672
Link To Document :
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