Title :
A method to determine the sensitization probability of a non-robustly testable path
Author :
Jayaraman, D. ; Tragoudas, Spyros
Author_Institution :
ECE Dept., Southern Illinois Univ., Carbondale, IL, USA
Abstract :
This paper presents a novel approach to determine the sensitization probability of a non-robustly testable path using probability density functions (PDFs). The proposed approach systematically refines a set of patterns that sensitize the path non-robustly which initial set has been derived with existing methods, and is kept implicitly. Accurate measure of the sensitization probability is obtained fast by avoiding Monte-Carlo. It is shown experimentally that the proposed approach is accurate and much faster than Monte-Carlo, and thus can be used to rank a collection of non-robust paths considering their sensitization characteristics.
Keywords :
Monte Carlo methods; circuit testing; probability; sensitivity analysis; Monte Carlo method; nonrobustly testable path; probability density functions; sensitization probability; Logic gates; Robustness; Binary Decision Diagrams (BDDs); Bounded Delay Model; Monte-Carlo; Non-Robust Sensitization; probability density functions (PDFs);
Conference_Titel :
Quality Electronic Design (ISQED), 2013 14th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4673-4951-2
DOI :
10.1109/ISQED.2013.6523683