• DocumentCode
    603028
  • Title

    Simulation of large-scale electric-ship DC-grids using the simulation tool VIAvento

  • Author

    Bartelt, R. ; Meyer, David ; Heising, Cartsten ; Khimchenko, Y. ; Staudt, Volker

  • Author_Institution
    Avasition GmbH, Dortmund, Germany
  • fYear
    2013
  • fDate
    22-24 April 2013
  • Firstpage
    269
  • Lastpage
    274
  • Abstract
    DC-ship grids are converter-dominated grids where the overall stability very strongly depends on the controls of the involved converters. Due to the non-linear structure of the control algorithms, a realistic stability assessment can only be achieved in time domain. To avoid non-realistic simulation results, a holistic model of the overall system including continuous and discrete elements and their original control algorithms has to be generated. Within this paper, the modelling approach for power-electronic devices including their non-ideal characteristics in time domain in the new simulation tool VIAvento is presented. The non-ideal characteristics are described briefly and the capability of this approach is demonstrated with simulation results of a DC grid with several independent converters in multi-level topology. Additionally, results of a resonant converter for lower power are given.
  • Keywords
    continuous systems; discrete systems; electric vehicles; marine power systems; nonlinear control systems; power convertors; power electronics; power grids; power system simulation; power system stability; ships; VIAvento; continuous elements; control algorithms; converter-dominated grids; discrete elements; large-scale electric ship DC-grid simulation; multilevel topology; nonideal characteristics; nonlinear structure; power electronic devices; resonant converter; simulation tool; stability assessment; Capacitors; Insulated gate bipolar transistors; Resonant frequency; Semiconductor diodes; Simulation; Switches; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Ship Technologies Symposium (ESTS), 2013 IEEE
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    978-1-4673-5243-7
  • Type

    conf

  • DOI
    10.1109/ESTS.2013.6523745
  • Filename
    6523745