• DocumentCode
    60352
  • Title

    Schottky Collector Bipolar Transistor Without Impurity Doped Emitter and Base: Design and Performance

  • Author

    Nadda, Kanika ; Kumar, M.J.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, New Delhi, India
  • Volume
    60
  • Issue
    9
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    2956
  • Lastpage
    2959
  • Abstract
    In this brief, we report an alternative approach of implementing a Schottky collector bipolar transistor without doping the ultrathin silicon-on-insulator film. Using different metal work function electrodes, the electrons and holes are induced in an intrinsic silicon film to create the n-emitter and the p-base regions, respectively. Using 2-D device simulation, the performance of the proposed device has been evaluated. Our results demonstrate that the charge plasma-based bipolar transistor with Schottky collector exhibits a high current gain and a better cutoff frequency compared with its conventional counterpart.
  • Keywords
    bipolar transistors; silicon-on-insulator; 2D device simulation; SOI; Schottky collector bipolar transistor; charge plasma-based bipolar transistor; electrons; holes; intrinsic silicon film; metal work function electrodes; n-emitter regions; p-base regions; ultrathin silicon-on-insulator film; Bipolar transistors; Metals; Plasmas; Semiconductor process modeling; Silicon; Transistors; CMOS technology; Schottky collector bipolar transistor; current gain; silicon-on-insulator; simulation;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2272943
  • Filename
    6570513