DocumentCode :
60352
Title :
Schottky Collector Bipolar Transistor Without Impurity Doped Emitter and Base: Design and Performance
Author :
Nadda, Kanika ; Kumar, M.J.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, New Delhi, India
Volume :
60
Issue :
9
fYear :
2013
fDate :
Sept. 2013
Firstpage :
2956
Lastpage :
2959
Abstract :
In this brief, we report an alternative approach of implementing a Schottky collector bipolar transistor without doping the ultrathin silicon-on-insulator film. Using different metal work function electrodes, the electrons and holes are induced in an intrinsic silicon film to create the n-emitter and the p-base regions, respectively. Using 2-D device simulation, the performance of the proposed device has been evaluated. Our results demonstrate that the charge plasma-based bipolar transistor with Schottky collector exhibits a high current gain and a better cutoff frequency compared with its conventional counterpart.
Keywords :
bipolar transistors; silicon-on-insulator; 2D device simulation; SOI; Schottky collector bipolar transistor; charge plasma-based bipolar transistor; electrons; holes; intrinsic silicon film; metal work function electrodes; n-emitter regions; p-base regions; ultrathin silicon-on-insulator film; Bipolar transistors; Metals; Plasmas; Semiconductor process modeling; Silicon; Transistors; CMOS technology; Schottky collector bipolar transistor; current gain; silicon-on-insulator; simulation;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2272943
Filename :
6570513
Link To Document :
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