Title :
Studies on reliability of PVC-graphite thick film resistors
Author :
Poornaiah, B. ; Rambabu, B. ; Subrahmanyam, K.V. ; SrinivasaRao, Y.
Author_Institution :
Dept. of Instrum. Technol., Andhra Univ. Coll. of Eng., Visakhapatanam, India
Abstract :
This investigation is undertaken to determine the reliability of PVC-graphite thick film resistors by determining the potential failure mechanism and the mean time - to - failure. Different drift functions are described for PVC-graphite thick film resistors with different PVC-graphite compositions. The values of the functional parameters depend strongly on the storage test temperature. The mean-to-failure of the PVC-graphite thick film resistors are calculated using Pranchov´s model for reliability prediction of thick film resistors.
Keywords :
graphite; semiconductor device reliability; thick film resistors; C; PVC-graphite thick film resistor reliability prediction; Pranchov model; failure mechanism; mean time-to-failure; Equations; Graphite; Polymers; Reliability; Resistance; Resistors; Thick films; Polymer resistors; composition; reliability;
Conference_Titel :
Automation, Computing, Communication, Control and Compressed Sensing (iMac4s), 2013 International Multi-Conference on
Conference_Location :
Kottayam
Print_ISBN :
978-1-4673-5089-1
DOI :
10.1109/iMac4s.2013.6526460
