DocumentCode :
60484
Title :
Inference for a Failure Counting Process Partially Observed
Author :
Guerineau, Lise ; Gouno, Evans
Author_Institution :
Dept. of Reliability, availability for Electr. Networks, Electricite de France R&D, Paris, France
Volume :
64
Issue :
1
fYear :
2015
fDate :
Mar-15
Firstpage :
311
Lastpage :
319
Abstract :
We consider a system defined as a collection of two types of components. The number of failures of each component is described as a stochastic process, with one of the processes depending on the other. None of the processes is observed directly. The only available information is the number of type 1 components at risk in the system. Because of this missing data situation, different algorithms relying on an Expectation Maximization (EM) strategy are proposed to obtain the MLE of the intensity parameters for both processes so we can assess the reliability of type 1 and type 2 components. To overcome the computational limits of EM, a Monte Carlo EM (MCEM) algorithm using a Metropolis procedure is presented. Stochastic EM (SEM) algorithms including a Bayesian approach are also described. The methods are applied to simulated data to demonstrate their efficiency.
Keywords :
Bayes methods; Monte Carlo methods; expectation-maximisation algorithm; failure analysis; reliability theory; Bayesian approach; EM strategy; MCEM algorithm; MLE; Metropolis procedure; Monte Carlo EM algorithm; SEM algorithm; expectation maximization strategy; intensity parameters; missing data situation; partially observed failure counting process; stochastic EM algorithm; stochastic process; type 1 component reliability; type 2 component reliability; Approximation algorithms; Maximum likelihood estimation; Monte Carlo methods; Power cables; Reliability; Stochastic processes; Vectors; Bayesian estimation; Metropolis algorithm; Monte Carlo methods; Poisson process; birth process; expectation maximization algorithm; maximum likelihood;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2014.2354171
Filename :
6894240
Link To Document :
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