DocumentCode
604876
Title
Real time monitoring and availability of server airflow for efficient data center cooling
Author
Ahuja, Narendra ; Rego, C.W. ; Ahuja, Satyajeet ; Shen Zhou ; Shrivastava, S.
Author_Institution
Senior Data Center Architect, Intel Corp., DuPont, WA, USA
fYear
2013
fDate
17-21 March 2013
Firstpage
243
Lastpage
247
Abstract
In a typical data center, a significant portion of the total power consumption is spent on data center cooling. This paper addresses the problem of cooling inefficiency resulting from airflow mismatch between what is required by the IT equipment vs. what is supplied by the facility fans. The paper proposes two new virtual sensors for a server; volumetric airflow and outlet temperature sensor. A method for calculating server volumetric airflow in real time based on fan RPM values is outlined. The calculated volumetric airflow and outlet temperature are exposed to Intel Data center Manager (DCM) using IPMI commands. DCM can then aggregate server airflow to compute airflow demand by rack, row or data center level. The information can be used to control facility fans to improve cooling efficiency of the data center. This represents a significant improvement over use of expensive temperature & pressure sensors distributed throughout the data center to control facility fans.
Keywords
air conditioning; building management systems; computer centres; fans; power consumption; temperature measurement; temperature sensors; DCM; IPMI commands; IT equipment; Intel data center manager; airflow mismatch; data center level; efficient data center cooling; facility fans; fan RPM values; outlet temperature sensor; pressure sensors; rack; real-time monitoring; server airflow availability; server volumetric airflow; total power consumption; virtual sensors; Atmospheric modeling; Data models; Energy consumption; Fans; Servers; Air Conditioning Unit; Air Handling Unit; Computer room air conditioner; Cubic feet per minute; Power Usage Effectiveness; TCO Total Cost of Ownership;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM), 2013 29th Annual IEEE
Conference_Location
San Jose, CA
ISSN
1065-2221
Print_ISBN
978-1-4673-6427-0
Electronic_ISBN
1065-2221
Type
conf
DOI
10.1109/SEMI-THERM.2013.6526836
Filename
6526836
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