Title :
Numerical derivations of locking ranges for injection-locked class-E oscillator
Author :
Nagashima, Tomoharu ; Wei, Xiuqin ; Tanaka, Hiroya ; Sekiya, Hiroo
Author_Institution :
Grad. Sch. of Adv. Integration Sci., Chiba Univ., Chiba, Japan
Abstract :
This paper presents numerical derivations of locking ranges for the injection-locked class-E oscillator with various injection-signal waveforms. The class-E oscillator achieves high-power-conversion efficiency at high frequencies by satisfying the class-E ZVS/ZDS conditions. The operating frequency of the class-E oscillator is synchronized with the frequency of an injection signal into MOSFET gate terminal, if the signal falls within the locking range. Locking ranges are investigated and discussed by injecting various types of injection signals. It is seen from the results that the locking range becomes wide as the fundamental-frequency component of the injection-signal waveform is large.
Keywords :
MOSFET; injection locked oscillators; numerical analysis; zero voltage switching; MOSFET gate terminal; ZDS conditions; ZVS conditions; fundamental-frequency component; high-power-conversion efficiency; injection-locked class-E oscillator; injection-signal waveforms; locking ranges; numerical derivations; Frequency synchronization; Logic gates; MOSFET; Oscillators; RLC circuits; Switches; Synchronization; Class-E oscillator; injection-locked oscillator; locking range;
Conference_Titel :
Power Electronics and Drive Systems (PEDS), 2013 IEEE 10th International Conference on
Conference_Location :
Kitakyushu
Print_ISBN :
978-1-4673-1790-0
Electronic_ISBN :
2164-5256
DOI :
10.1109/PEDS.2013.6527169