Title :
Complete Device Level Validation of Solid State Flash Drives -- An Approach
Author :
Subramani, R. ; Radhakrishnan, B. ; Puttaiah, K.
Author_Institution :
Integrated Eng. Services, Mahindra Satyam, Hyderabad, India
Abstract :
This paper highlights the Device level testing of SATA SSD´s (Solid State Drives). Device level testing aims at testing the intrinsic functionality of the storage devices. Commands are issued to the SSD under test to validate the attributes such as methods of transfer, latest technology involved to structure the storage device functionality, performance and the adherence to the protocol (SATA protocol). Performance test validation is required for NAND flash components and is used to substantiate the data performance read/write claims. The types of testing at the device level are Conformal testing, Non Performance Command Testing and Performance Command Testing. This paper outlines the process involved in validating SSD´s (SATA).
Keywords :
conformance testing; device drivers; flash memories; protocols; NAND flash component; SATA SSD; SATA protocol; conformal testing; data performance read/write claim; device level testing; device level validation; nonperformance command testing; performance test validation; solid state flash drive; storage device functionality; storage device performance; Built-in self-test; Computer aided manufacturing; Performance evaluation; Protocols; Software; Solids; CAM Tests; Conformal testing; Device level testing; Feature Tests and Performance Tests; IOPS; LBA; SATA; SSD;
Conference_Titel :
Computer Modelling and Simulation (UKSim), 2013 UKSim 15th International Conference on
Conference_Location :
Cambridge
Print_ISBN :
978-1-4673-6421-8
DOI :
10.1109/UKSim.2013.102