Title :
EPC Class 1 GEN 2 UHF RFID tag emulator for robustness evaluation and improvement
Author :
Abdelmalek, O. ; Hely, D. ; Beroulle, V.
Author_Institution :
Grenoble Inst. of Technol., Valence, France
Abstract :
RFID ICs such as EPC Class 1 GEN2 tag are low cost tags which are in some cases used for critical or secure applications. Increasing their robustness is not trivial due to the wide range of error sinks (EM perturbations, attacks...). Moreover increasing the robustness must have a minimum impact on the die area but also must fit with a standardized protocol. In this work we propose a design methodology in order to develop hardened digital tag architecture with a dedicated verification environment taking into account all RFID system parameters
Keywords :
integrated circuit design; integrated circuit reliability; integrated circuit testing; radiofrequency identification; radiofrequency integrated circuits; EPC class 1 GEN 2 UHF RFID tag emulator; RFID IC; RFID system parameter; design methodology; hardened digital tag architecture; robustness evaluation; verification environment; Decision support systems; Diffusion tensor imaging; Nanoscale devices; EPC; FPGA prototype; Fault Injection; RFID Security; RFID attacks; Robust IC; Secure IC;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2013 8th International Conference on
Conference_Location :
Abu Dhabi
Print_ISBN :
978-1-4673-6039-5
Electronic_ISBN :
978-1-4673-6038-8
DOI :
10.1109/DTIS.2013.6527771