DocumentCode
605542
Title
Greek cross test structure for inkjet printed thin films
Author
Diaz, Edgar ; Ramon, E. ; Carrabina, Jordi
Author_Institution
Microelectron. & Electron. Syst. Dept., Univ. Autonoma de Barcelona, Barcelona, Spain
fYear
2013
fDate
25-28 March 2013
Firstpage
167
Lastpage
172
Abstract
This paper reports on usage of Greek cross test structure to characterize geometry of inkjet printed electronics circuits. Geometric characteristics extracted from optical characterization can be correlated with electric measurements for square resistance in order to speed up the characterization processes. Design of inkjet printed Greek cross test structure should consider the ink coalescence and coffee ring effects.
Keywords
electric resistance measurement; geometry; ink jet printing; thin film circuits; Greek cross test structure; coffee ring effects; ink coalescence; inkjet printed electronics circuit geometry; inkjet printed thin films; optical characterization; square resistance electric measurements; Ink; Liquids; Printing; Resistance; Shape; Substrates; Geometrical Characterization; Greek Cross Test Structure; Inkjet Printed Electronics;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on
Conference_Location
Osaka, Japan
ISSN
1071-9032
Print_ISBN
978-1-4673-4845-4
Electronic_ISBN
1071-9032
Type
conf
DOI
10.1109/ICMTS.2013.6528166
Filename
6528166
Link To Document