Efficient technique for Si validation of level shifters

This paper presents a new structure that uses an addressable parametric array to validate level shifter cells. This structure is very area efficient and allows direct measurement of input and output voltages. Being a parametric structure enabled direct measurement of the output voltages, a critical parameter for level shifters. Experimental data confirmed the utility of this approach, validating level shifters in three different power domains including source biasing on the same 22-pad design. The simulation results show good correlation with the measured data.