Title :
Development of a relay test bench and an arbitrary waveform generator in RTAI-Linux platform
Author :
Hazarika, P.P. ; Shubhanga, K.N.
Author_Institution :
Dept. of Electr. & Electron. Eng., NITK Surathkal, Surathkal, India
Abstract :
This paper presents the development of a PC-based relay test bench and an arbitrary waveform generator using an open-source Real-Time Application Interface (RTAI) in Linux environment. Such a setup not only permits the generation of any arbitrary waveforms: steady-state signals as well as transients, but also simplifies the testing of various single-phase or three-phase static relays such as over-voltage relay, directional power relay, negative sequence relay as well as numerical impedance relays. The actuating signal is fed to the relay under test using a set-up that consists of a PCI card with a built-in Digital to Analog Converter and a feedback circuit for detecting the status of the relay. Using any off-line simulation package, sampled data points of a desired waveform are obtained in the form of a data-file. The RTAI-Linux program generates this waveform in real-time which is directly fed to the relay under test. The relay test bench presented in this paper is a cost-effective set-up for laboratories to test and understand the behavior and characteristics of relaying systems.
Keywords :
Linux; digital simulation; digital-analogue conversion; peripheral interfaces; power engineering computing; power system protection; public domain software; relay protection; waveform generators; PC-based relay test bench; PCI card; RTAI-Linux platform; arbitrary waveform generator; built-in digital to analog converter; directional power relay; feedback circuit; negative sequence relay; numerical impedance relay; open-source real-time application interface; over-voltage relay; single-phase static relays; steady-state signals; three-phase static relays; Kernel; Linux; Oscilloscopes; Real-time systems; Relays; Signal generators; Testing; Open-source software; Real time systems; Relays; Signal Processing; Testing;
Conference_Titel :
Emerging Trends in Computing, Communication and Nanotechnology (ICE-CCN), 2013 International Conference on
Conference_Location :
Tirunelveli
Print_ISBN :
978-1-4673-5037-2
DOI :
10.1109/ICE-CCN.2013.6528569