Title :
Time constant of the current drawn by the device and the corresponding noise for a given Power Delivery network
Author :
Bhattacharyya, Bidyut K. ; Baral, Debasis
Author_Institution :
Torit, San Jose, USA
Abstract :
In this paper we have shown a method by which we can determine the relationship between the time constant of the current ramp by the device and the corresponding ground and power noise of any silicon device, for a given Power Delivery network. This relationship can be used for statistical analysis of the power delivery network.
Keywords :
Capacitance; Integrated circuits; Noise; CPU Power; PDN; Power Delivery Network; Silicon Process; dI/dt. Time Constant; exponential rise time; noise in Silicon Chip;
Conference_Titel :
Circuits, Power and Computing Technologies (ICCPCT), 2013 International Conference on
Conference_Location :
Nagercoil
Print_ISBN :
978-1-4673-4921-5
DOI :
10.1109/ICCPCT.2013.6528949
