DocumentCode :
60667
Title :
A Deterministic Digital Background Calibration Technique for VCO-Based ADCs
Author :
Sachin Rao ; Reddy, Karthikeyan ; Young, B. ; Hanumolu, Pavan Kumar
Author_Institution :
Qualcomm Technol., Santa Clara, CA, USA
Volume :
49
Issue :
4
fYear :
2014
fDate :
Apr-14
Firstpage :
950
Lastpage :
960
Abstract :
This paper presents a digital background calibration technique to realize a linear voltage-controlled-oscillator (VCO) based ADC. The distortion caused due to the VCO´s nonlinear tuning characteristics is eliminated by introducing an inverse voltage-to-frequency transfer function in the signal path. The proposed calibration unit runs in the background and detects the inverse transfer function using a highly digital frequency locked loop. Like many other VCO-based ADCs, the proposed technique does not require analog building blocks such as operational amplifiers, multi-bit feed-back DACs etc., and retains the scaling friendly properties. Implemented in a 90 nm CMOS process, the on-chip calibration improves SNDR of an open-loop VCO-based ADC from 46 dB to more than 73 dB in 5 MHz signal bandwidth while consuming 4.1 mW power. The ADC achieves a figure-of-merit of 91-112 fJ/conv-step for different input frequencies.
Keywords :
CMOS integrated circuits; analogue-digital conversion; calibration; frequency locked loops; transfer functions; voltage-controlled oscillators; CMOS process; SNDR; analog to digital converter; bandwidth 5 MHz; calibration unit; deterministic digital background calibration technique; figure-of-merit; highly digital frequency locked loop; inverse voltage-to-frequency transfer function; linear voltage-controlled-oscillator; nonlinear tuning characteristics; on-chip calibration; open-loop VCO-based ADC; power 4.1 mW; scaling friendly properties; signal path; size 90 nm; Calibration; Clocks; Delays; Frequency conversion; Radiation detectors; Tuning; Voltage-controlled oscillators; Background calibration; VCO based ADC; calibration; deterministic calibration; open-loop delta sigma; time based ADC;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2013.2293753
Filename :
6712154
Link To Document :
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