Title :
Maintenance of solder joints on the strength of simultaneously acting creep and fatigue phenomena by using microindentation technique
Author :
Jankowski, K. ; Swierczynski, R. ; Urbanski, Konrad ; Wymyslowski, A. ; Chicot, D. ; Dudek, Rainer
Author_Institution :
Fac. of Microsyst. Electron. & Photonics, Wroclaw Univ. of Technol., Wroclaw, Poland
Abstract :
Last decades in reliability prototyping of microelectronic devices show that from a long time there is no good solution to examine it in relatively short time and small expenditure of costs. Currently all thermo-mechanical reliability processes are long-lasting and costly. With using only the most dominating failure mode and cyclic loadings tests can last for a number of months. Companies, which produce their products very fast can´t allow on such inconvenience, because this would lead to bankruptcy. To solve that kind of problem in this paper will be proposed new method of reliability investigating. Most of existing methods are concerned on only one failure mode which is dominating under selected loading conditions. Moreover all failure analysis are done under the simplified conditions what means that obtained results are not properly reliable. New presented method aim at using typical failure modes creep and fatigue at the same time while testing. That solution can have an important meaning in the standard Accelerated Thermal Cyclic test, which are based partly on experiment measurements and numerical analysis. Therefore appropriate understanding and development of analytical methods and experimental tools for multifailure criteria analysis could be very helpful. This work presents a methodology based on the use of well known indentation technique and second, innovative method with using new instrument called Failure And Reliability Investigation System created to study creep and fatigue phenomenon carried out on two lead-free alloys: SAC 405(S-SnAg4Cu0.5) and SAC 307(S-SnAg3Cu0.7).
Keywords :
copper alloys; creep; failure analysis; fatigue; integrated circuit packaging; life testing; numerical analysis; reliability; silver alloys; solders; tin alloys; SnAg3Cu0.7; SnAg4Cu0.5; bankruptcy; creep phenomena; cyclic loadings tests; failure analysis; failure and reliability investigation system; failure mode; failure modes creep; fatigue phenomena; indentation technique; lead-free alloys; loading conditions; microelectronic devices; microindentation technique; multifailure criteria analysis; numerical analysis; reliability prototyping; solder joints maintenance; standard accelerated thermal cyclic test; thermomechanical reliability processes; Abstracts; Analytical models; Force; Load modeling; Numerical models; Reliability; Temperature measurement;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2013 14th International Conference on
Conference_Location :
Wroclaw
Print_ISBN :
978-1-4673-6138-5
DOI :
10.1109/EuroSimE.2013.6529921