Title :
Non-conforming meshes in multi-scale thermo-mechanical Finite Element Analysis of semiconductor power devices
Author :
Eiser, S. ; Kaltenbacher, Manfred ; Nelhiebel, Michael
Author_Institution :
Kompetenzzentrum Automobil- und Industrielektronik (KAI), Villach, Austria
Abstract :
A thermo-mechanical investigation of a Smart Power Switch using the Finite Element Method is presented. We consider a non-conforming discretization of the computational domain to bridge the scales. It allows a high degree of flexibility for discretizing the region where a fine mesh is required. We benchmark a simplified, Lagrange multiplier based displacement method in terms of accuracy and runtime. Compared to the widespread submodeling technique, it eliminates the need for elaborate homogenization methods. Results are shown for two and three-dimensional problems.
Keywords :
finite element analysis; power MOSFET; semiconductor device models; Lagrange multiplier; computational domain; displacement method; multiscale thermomechanical finite element analysis; nonconforming discretization; nonconforming meshes; semiconductor power devices; smart power switch; Abstracts; Benchmark testing; ISO standards; Industries; Switches;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2013 14th International Conference on
Conference_Location :
Wroclaw
Print_ISBN :
978-1-4673-6138-5
DOI :
10.1109/EuroSimE.2013.6529946