• DocumentCode
    606885
  • Title

    Non-conforming meshes in multi-scale thermo-mechanical Finite Element Analysis of semiconductor power devices

  • Author

    Eiser, S. ; Kaltenbacher, Manfred ; Nelhiebel, Michael

  • Author_Institution
    Kompetenzzentrum Automobil- und Industrielektronik (KAI), Villach, Austria
  • fYear
    2013
  • fDate
    14-17 April 2013
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    A thermo-mechanical investigation of a Smart Power Switch using the Finite Element Method is presented. We consider a non-conforming discretization of the computational domain to bridge the scales. It allows a high degree of flexibility for discretizing the region where a fine mesh is required. We benchmark a simplified, Lagrange multiplier based displacement method in terms of accuracy and runtime. Compared to the widespread submodeling technique, it eliminates the need for elaborate homogenization methods. Results are shown for two and three-dimensional problems.
  • Keywords
    finite element analysis; power MOSFET; semiconductor device models; Lagrange multiplier; computational domain; displacement method; multiscale thermomechanical finite element analysis; nonconforming discretization; nonconforming meshes; semiconductor power devices; smart power switch; Abstracts; Benchmark testing; ISO standards; Industries; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2013 14th International Conference on
  • Conference_Location
    Wroclaw
  • Print_ISBN
    978-1-4673-6138-5
  • Type

    conf

  • DOI
    10.1109/EuroSimE.2013.6529946
  • Filename
    6529946